Nitride LEDs are universally used for energy-efficient lighting. They are extremely efficient at low indium content and low current density, allowing to produce commercial white LEDs from a blue LED and a phosphor that absorbs blue and re-emits a broad spectrum in the visible range. However, nitride LEDs suffer from a drastic drop in efficiency at higher current densities and higher indium concentrations, for emission in the green or red. This is an obstacle to extending their use, in order to obtain higher efficiencies with less material, as well as better color rendering. These efficiency drops are partly due to an increase in three-particle Auger-Meitner processes, which are strongly impacted by local device heterogeneities, and can be reduced by specific engineering of structural defects in nitride materials. This thesis proposes to study the electronic processes in nitride LEDs in operando, using electro-emission microscopy. In particular, charge injection mechanisms in the active part of the LEDs and Auger-Meitner processes will be investigated and quantified. The spatial resolution of the technique will allow to characterize the role of heterogeneities (defects or alloy disorder) in the loss processes.

Material failure is a concern for scientists and engineers worldwide. This includes oxide glasses, which are integral parts of building, electronics, satellites due to multiple advantageous features, including optical transparency, elevated mechanical and thermal properties, chemical durability, biocompatibility and bioactivity, etc. Despite this, oxide glasses have a significate drawback: they are inherently brittle. Oxide glasses are well known to undergo dynamic fracture (crack propagation velocity of ~km/s – as in the case of a glass crashing to the floor and shattering); yet, there is another fracture mode less noticeable that will be studied during this thesis, where crack fronts grow sub-critically. The growth of these crack fronts is aided by environmental parameters including atmospheric humidity and temperature, and the crack front velocity depends on the local stress felt by a crack tip, coined the stress intensity factor.

Currently, our experimental setup tracks the crack front position in time via a tubular microscope equipped with a camera. Post-analysis of images provides the crack front velocity and reveals the environmental limit K_e and region I. However, the current experimental setup cannot capture regions II and III. Several factors play into this limitation: elevated crack front velocity (10e-4 to 1500 m/s), sample size (5×5×25 mm^3), camera acquisition rates, etc.

In recent years, our team has used the potential drop technique to track the crack front velocity when v > 10e-4 m/s in PMMA. This technique involves the deposition of conductive strips on the sample surface. Subsequently, these lines are attached to a high frequency oscilloscope. As the crack front propagates through the sample, the lines are severed resulting in an increase in the electrical resistance. We now wish to adapt this technique to DCDC samples on oxide glasses. The thesis goal is the development and application of the potential drop techniques to DCDC samples. The challenge concerns the spatial temporal resolution (50 µm and 1 ns) in comparison to the crack tip velocity and sample size. The thesis student will take part in all the steps to realize the experiments: designing and depositing patterns (series of strips) on the glass surfaces using a cleanroom, running sub-critical cracking experiments in Region II and III, and analyzing data acquired during the experiment.