As part of the FAMES project and the European ChipACT initiative, which aim to ensure France’s and Europe’s sovereignty and competitiveness in the field of electronic nano-components, CEA-LETI has launched the design of new FD-SOI chips. Among the various modules being developed, the fabrication of electrical contacts is one of the most critical modules in the success of advanced node development.
For sub-10 nm node, the contact realization is facing a lot of challenges like punchthrough (due to low etch selectivity during contact etching), voids during metal deposition, self-alignment, and parasitic capacitance. New breakthrough approach has recently been proposed consisting in the deposition of new dielectric films with chemical gradient. This thesis focuses on the development (deposition an etching processes) of new gradient compounds incorporated into SiO2 to address the current issues.