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Thesis
Home   /   Thesis   /   Cryogenic characterization of emerging memories for space and/or quantum computing applications

Cryogenic characterization of emerging memories for space and/or quantum computing applications

Advanced nano characterization Technological challenges

Abstract

Low temperature computing is a new proposal to boost the technological performances beyond the frontiers in the aerospace, high performance servers, quantum computing and data center domain.
Different emerging technologies have been showing promising features at single device level during the ongoing Ph.D. work: the programmability of the OxRAMs was proved down to 4K and efforts were focused on the understanding of the interactions between the selector and the resistor composing the memory cell. FeRAMs show a better programming efficiency and stability at low temperature probably due to a crystallographic change driven by the program operation; hypothesis that lies unproved. PCM also showed a programmability down to 12K and may be included in the analysis.
Statistical behavior of R&D chip at low temperature will be the key theme of this proposition knowing that very few publications appeared in the scientific literature leaving much room for analysis and comprehension.
Throughout this Ph. D., you will gain a broad spectrum of knowledge, spanning cryogenics, microelectronics reliability and device physics. Different technologies developed in LETI will be statistically screened in this innovative scenario. Modeling of the conduction phenomena might be also considered. You will be part of a team of 7-8 people between permanent, researchers and students and you will be managed to share your work with them.

Laboratory

Département Composants Silicium (LETI)
Service Caractérisation, Conception et Simulation
Laboratoire Caractérisation Electrique et Fiabilité
Université Grenoble Alpes
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