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Thesis
Home   /   Thesis   /   Electrical characterization and optimization of III-V HBT on Si for 6G and datacom applications

Electrical characterization and optimization of III-V HBT on Si for 6G and datacom applications

Electronics and microelectronics - Optoelectronics Emerging materials and processes for nanotechnologies and microelectronics Engineering sciences Technological challenges

Abstract

As digital content demand surges, 6G systems face major challenges, particularly in developing power amplifiers for Sub-THz frequencies. These frequencies promise ultra-high data rates but push the limits of current silicon technology. In AI datacenters, optical communication between GPUs is a must to reduce the total energy usage, compared to classical wiring. The highest speed devices are then needed in photodetectors & lasers’ electrical drivers. InP-based Heterojunction Bipolar Transistors (HBTs) on large silicon substrates offer a promising solution, combining high-speed performance with minimal system losses. This technology comes with the challenges of integrating III-V layers with CMOS-compatible processes while allowing promising new device architectures, for both electrical parasitics reduction and self-heating management.
This PhD program aims to guide Leti’s III-V HBT on Si developments to optimize the device architecture and increase the RF performance.
In this program the student will:
Perform electrical characterization of various device geometries and technological splits through DC and RF measurements such as IV, thermal analysis, S-parameters and possibly Load-Pull.
Simulate key parasitics and new device architectures to understand device limitations
Collaborate closely with process engineers to link electrical results with fabrication choices and guide device optimization

Laboratory

Département Composants Silicium (LETI)
Service des Composants pour le Calcul et la Connectivité
Laboratoire des Transistors Avancés
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