The nanocaracterisation platform of the CEA Grenoble has recently installed 2 state-of-the-art tools for 3-D imaging with 100 nm resolution: X-ray tomography in a SEM and time of flight secondary ion mass spectrometry (ToF-SIMS) assisted by focused ion milling (FIB). X-ray tomography delivers non-invasive 3-D images of the internal morphology of an object whilst ToF-SIMS is able to map the local composition in 3-D. We aim to combine the two techniques to perform quantitative 3-D investigations of objects such as copper pillars for microelectronics or silicon electrodes for Li battery applications.
The proposed research subject is data analysis orientated. Some simulation work may be performed to implement and test existing 3-D data fusion methods with a view to adapting and improving them. The candidate will assist with the experimental measurements and be responsible for treating the data with the chosen protocols. The candidate should be pragmatic, at ease with applied mathematics and have good programming skills. These will be essential in understanding and manipulating the fusion and reconstruction algorithms, from the simplest, to the increasingly advanced (prior information, superiorisation, Bayesian fusion)
The candidate will have completed a PhD in physics and have good computer (Python, Matlab, C) and image treatment skills, or a PhD in mathematics/computational science with an interest in applications. The candiate will need to interface with a multidisciplinary team, and be receptive to new ideas. The candidate will be proficient in both written and spoken English in order to communicate with the team and to disseminate their results in articles or at conferences.