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Thesis
Home   /   Thesis   /   High-Endurance Chalcogenide Memories for Next-Generation AI

High-Endurance Chalcogenide Memories for Next-Generation AI

Emerging materials and processes for nanotechnologies and microelectronics Technological challenges

Abstract

Discover a unique phd opportunity where you will dive into the heart of innovation in memory technologies. You will develop strong expertise in areas such as electrical characterization and the understanding of degradation phenomena in chalcogenide-based memories.

By joining our multidisciplinary teams, you will play a key role in studying and improving the endurance of Phase-Change Memory (PCM) and Threshold Change Memory (TCM) devices—two promising technologies for high-performance artificial intelligence applications. You will take part in innovative projects combining scientific rigor and applied research on nanoscale devices, working closely with another CEA PhD student who conducts advanced physico-chemical analyses (TEM) to investigate degradation mechanisms.

You will have the opportunity to contribute actively to tasks such as:

Electrical characterization of PCM and TCM devices to analyze cycling-induced degradation
Development and evaluation of innovative programming protocols to extend endurance limits
Proposing solutions to improve the reliability and performance of next-generation memories
Regular collaboration and discussion with the CEA PhD student to interpret TEM results and draw conclusions about degradation mechanisms

Laboratory

Département Composants Silicium (LETI)
Service Caractérisation, Conception et Simulation
Laboratoire Caractérisation Electrique et Fiabilité
Université Grenoble Alpes
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