In the field of infrared astrophysics, the most commonly used photon sensors are detector arrays based on the HgCdTe absorbing material. The manufacturing of such detectors is a globally recognized expertise of CEA/Leti in Grenoble. As for the Astrophysics Department (DAp) of CEA/IRFU, it holds renowned expertise in the characterization of this type of detector. A key characteristic is the pixel spatial response (PSR), which describes the response of an individual pixel in the array to the point-like generation of carriers within the absorbing material at various locations inside the pixel. Today, this detector characteristic has become a critical parameter for instrument performance. It is particularly crucial in applications such as measuring galaxy distortion or conducting high-precision astrometry. Various methods exist to measure this quantity, including the projection of point light sources and interferometric techniques. These methods, however, are complex to implement, especially at the cryogenic operating temperatures of the detectors.
At the DAp, we propose a new method based on the use of X-ray photons to measure the PSR of infrared detectors. By interacting with the HgCdTe material, the X-ray photon generates carriers locally. These carriers then diffuse before being collected. The goal is to derive the PSR by analyzing the resulting images. We suggest a two-pronged approach that integrates both experimental methods and simulations. Data analysis methods will also be developed. Thus, the ultimate objective of this thesis is to develop a new, robust, elegant, and fast method for measuring the intra-pixel response of infrared detectors for space instrumentation. The student will be based at the DAp. This work also involves collaboration with CEA/Leti, combining the instrumental expertise of the DAp with the technological knowledge of CEA/Leti.