The advent of artificial intelligence makes it possible to accelerate and democratize the processing of small-angle X-ray scattering (SAXS) data, an expert technique for characterizing nanomaterials that allows to determine the specific surface area, volume fraction and characteristic sizes of structures between 0.5 to 200 nm.

However, there is a double problem around SAXS assisted by Artificial Intelligence: 1) the scarcity of data requires training the models on synthetic data, which poses the problem of their representativeness of real data, and 2) the laws of physics stipulate that several candidate nanostructures can correspond to a SAXS measurement, which poses the problem of the indistinguishability of predictions. This thesis therefore aims to build an artificial intelligence model adapted to SAXS trained on experimentally validated synthetic data, and on the expert response which weights the categorization of predictions by their indistinguishability.